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Alfa Chemistry is one of the service providers of graphene analysis and testing. We can use advanced technology to analyze your graphene products in detail. The surface properties of graphene play a vital role in its applications in composite materials, nano-coatings, and nano-electronic devices. Alfa Chemistry can characterize the layered structure of graphene by using high-resolution electron microscopy such as Transmission Electron Microscope (TEM) and Scanning Electron Microscope (SEM).
SEM uses an electron beam to scan the surface of the sample to excite secondary electrons. Secondary electron imaging can obtain the three-dimensional information of the sample surface topography. SEM has the advantages of high magnification, large depth of field and high resolution. It is widely used in graphene research, especially CVD graphene research.
Fig 1. SEM morphology of graphene powder. (Chen Z.L, et al, 2018)
Fig 2. SEM morphology of (a)graphene film prepared by CVD method and (b)graphene prepared by mechanical peeling method. (Chen Z.L, et al, 2018)
TEM uses a high-energy electron beam to pass through a thin film sample to obtain an image after focusing and magnification. TEM uses an electron beam as a light source and an electromagnetic field as a lens, so it has a higher resolution. In addition, due to the weak penetrating power of the electron beam, the sample used for the electron microscope needs to have a thickness of nanometer scale.
Fig.3 TEM and atomic-scale TEM images of the pure and boron-doped graphite. (Kim Y.A, et al, 2012)
Graphene, graphene oxide, reduced graphene oxide, nanographene and etc.
GB/T 30544.13-2018 ISO/TS 80004-13:2017(en): Graphene and Related Two-dimensional (2D) Materials.
Alfa Chemistry guarantees to provide customers with efficient and high-standard graphene surface morphology analysis services.
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